Ilion II

Model 697

The Ilion® II broad beam argon milling system is a tabletop tool for producing cross-sections and planar polishing of samples for examination in the scanning electron microscope (SEM) and other instruments. Each Ilion II system is suitable for polishing a wide range of materials, including samples made from multiple elements and alloys with a wide range of mechanical hardness, size and other physical characteristics.

Benefits

• WhisperLok system: Ability to load and unload samples without venting the main chamber
• Low energy focusing penning ion guns: Improved low energy milling for surface damage sensitive techniques such as electron backscatter diffraction (EBSD) or cathodoluminescence (CL)
• Variable energy from 0.1 – 8.0 kV: Improved low energy milling for reduction in amorphous layer and higher energy for faster milling
• LN₂ specimen cooling: Eliminates artifacts
• 10” color touch screen control: Simple but full control from the graphical user interface
• Digital zoom microscope: Operates in real-time while milling
• Color image storage in DM software: Ability to store and use optical images with the SEM data in the same format

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