Specimen Preparation Tools for TEM

The PIPS™ (precision ion polishing system) II is a revolutionary enhancement of the PIPS ion mill that has defined the standard for transmission electron microscope (TEM) sample preparation for over 20 years. ...

Specimen Preparation Tools for SEM

The PECS™ (precision etching coating system) II is a table top broad beam argon milling tool for polishing as well as coating samples. These two processes can be performed on the same sample without interruption of the vacuum....

Plasma Cleaner for TEM and SEM

The Solarus® II is the next-generation plasma tool to remove hydrocarbon contamination from TEM and SEM samples and holders. This system is ideal for researchers who want to reproducibly remove organic surface contaminants in...

Material Characterization (EDS-EBSD)

The enhanced Energy Dispersive Spectroscopy (EDS) system comes with the latest advancements in Silicon Drift Detector (SDD) technology and high-speed electronics. The EBSD Camera Series offers high-speed EBSD mapping with the best indexing performance on real-world materials & powered by a CMOS sensor....

Electron Microscopy Consumables

• Copper Grids
• Nickel Grids
• Molybdenum Grids
• Single Slot Grids
• Carbon Coated Copper Grids
• Carbon Coated Nickel Grids
• Carbon/Formvar Coated Copper Grids
• Double Side Carbon Tape