PIPS-II

Model 695

The PIPS™ (precision ion polishing system) II is a revolutionary enhancement of the PIPS ion mill that has defined the standard for transmission electron microscope (TEM) sample preparation for over 20 years.

Benefits

• WhisperLok with X, Y stage: Ability to center the region of interest for re-polish
• Low energy focusing penning ion guns: Improved low energy milling for focused ion beam (FIB) prepared samples
• Variable energy from 0.1 – 8.0 kV: Improved low energy milling for reduction in amorphous layer for corrected TEMs
• LN₂ specimen cooling: Eliminates artifacts
• 10” color touchscreen control: Simple but full control from the graphical user interface
• Digital zoom microscope: Operates in real-time while milling
• Color image storage in DigitalMicrograph software: Ability to store and use optical images with the TEM and EELS data in the same format

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